![]() ![]() Experimental results show that this compression method improves a compression ratio and a test time on both International Symposium on Circuits and Systems'89 and large International Test Conference'99 benchmark circuits in most cases compared to the results of the previous work without a heavy burden on the hardware.Rc-switch has built-in functions that sends codewords for certain natively supported devices – so If you have one of these devices (I don’t) you may be able to skip this step. Moreover, the TSC is used to increase the range information transmission without additional input ports. It is useful to reuse previously used data for making next data by using the function of feedback of the ring counter. For improving the compression efficiency, a twisted ring counter is used to reconfigure twist function. In this paper, we present a new test data compression method based on reusing a stored set with tri-state coding (TSC). According to these trends, increasing test data volume is one of the biggest challenges in the testing industry. Experimental results show that this compression method improves a compression ratio and a test time on both International Symposium on Circuits and Systems'89 and large International Test Conference'99 benchmark circuits in most cases compared to the results of the previous work without a heavy burden on the hardware.ĪB - As technology processes scale up and design complexities grow, system-on-chip integration continues to rise rapidly. N2 - As technology processes scale up and design complexities grow, system-on-chip integration continues to rise rapidly. This work was supported by the National Research Foundation of Korea (NRF) grand funded by the Korea government, Ministry of Science, ICT and Future Planning (No. ![]() T1 - Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression Experimental results show that this compression method improves a compression ratio and a test time on both International Symposium on Circuits and Systems'89 and large International Test Conference'99 benchmark circuits in most cases compared to the results of the previous work without a heavy burden on the hardware.", ![]() Abstract = "As technology processes scale up and design complexities grow, system-on-chip integration continues to rise rapidly.
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